Breakthrough white light scanner range starts beta trials
Wednesday 17th June 2009
Loughborough, UK, 17th June 2009: Phase Vision, a technology leader in optical metrology systems, announces it has started beta trials of its new 3D scanners.
The scanners use a new, patented approach to structured white light measurement. Use of white light allows the scanner to break through the “speckle limit” which restricts the accuracy of laser scanners, while the patented structured lighting technique offers order of magnitude performance benefits.
Phase Vision has been deploying the technology through bespoke metrology installations for several years; however this beta trial is the first time it has been available in a standard product.
Ralph Weir, CEO stated “Our core measurement technology is very well proven, but our first standard product is a robust unit intended for use on the shop floor – a breakthrough for white light. We want to ensure the product has real experience of that environment before launch. We’re thrilled with the partners who are working with it, and whose input into the final product will be invaluable.”
More details on Phase Vision are available on their website.
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