Modern manufacturing processes require tight dimensional tolerances and it is becoming increasingly important to ensure that these tolerances are maintained throughout the production cycle. In most instances, investment in monitoring and control of key dimensional tolerances gives manufacturers a competitive edge - through increased performance, improvements in quality, and waste reduction.
The scope of dimensional measurement spans a vast range of applications: from characterization of subatomic structures, through precision industrial manufacturing, and ultimately, to the measurement of the cosmic distances of space. In each case the measurement accuracy demanded is different and has lead to the development of a range of dedicated solutions.
Precision industrial manufacturers typically focus on inspection of components with sizes ranging from millimetres to metres, and require measurement accuracy in the range from 1 micron to 300 micron. This is commonly referred to as the "micro-scale" measurement market sector.
Traditional measurement solutions offered to the market rely heavily on mechanical gauging, often involving expensive high-quality mechanically engineered instruments to achieve these levels of accuracy. Mechanical CMMs, for example, offer excellent measurement precision, but they are slow and expensive - both to buy and to use.
More recent technologies offered to the market, such as laser line scanners, are often only deployed in QA labs to perform statistical analysis rather than inline process control.
Phase Vision is revolutionizing this market. Our 3D shape measurement scanning technologies are able to measure in excess of 1 million coordinates every second and are well suited for the inspection of complex freeform surfaces. Our systems are optimised for high-throughput, using efficient algorithms to distil the measured data into key geometric parameters that can be used as feedback signals to control your manufacturing process.
Contact us to enquire how this technology can conveniently reduce your surface inspection time by up to 100,000x (compared to CMM touch probe technology).
